Hello,
I have a SSD which executes all tests on off-line mode every four hours. That SSD is not shown in the mk_smart output, because mk_smart filters the smartctl output for the Always lines.
I changed grep Always to grep -P "(Always|Offline)" and how it works nice.
See checkmk/agents/plugins/smart at master · Checkmk/checkmk · GitHub
Is there some reason for this?
May I file a pull request for my change?
Regards
Christian
//edit
Powered on: 1 year 97 days, Power cycles: 99, Uncorrectable errors: 0, Reallocated sectors: 0, Reallocated events: 0 (normalized value: 100), Pending sectors: 0, UDMA CRC errors: 0
Mh, this is wrong. The SSD is at least four to five years old und is running since then 24/7.
Smartctl output:
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.83-1-pve] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Silicon Motion based SSDs
Device Model: TS128GSSD370S
Serial Number: D092252203
Firmware Version: O1225G
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Jan 8 23:36:27 2023 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 57) seconds.
Offline data collection
capabilities: (0x71) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 1) minutes.
Conveyance self-test routine
recommended polling time: ( 1) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x0000 100 100 000 Old_age Offline - 0
5 Reallocated_Sector_Ct 0x0000 100 100 000 Old_age Offline - 0
9 Power_On_Hours 0x0000 100 100 000 Old_age Offline - 11108
12 Power_Cycle_Count 0x0000 100 100 000 Old_age Offline - 99
160 Uncorrectable_Error_Cnt 0x0000 100 100 000 Old_age Offline - 0
161 Valid_Spare_Block_Cnt 0x0000 100 100 000 Old_age Offline - 131
163 Initial_Bad_Block_Count 0x0000 100 100 000 Old_age Offline - 34
164 Total_Erase_Count 0x0000 100 100 000 Old_age Offline - 421813
165 Max_Erase_Count 0x0000 100 100 000 Old_age Offline - 243
166 Min_Erase_Count 0x0000 100 100 000 Old_age Offline - 129
167 Average_Erase_Count 0x0000 100 100 000 Old_age Offline - 204
168 Max_Erase_Count_of_Spec 0x0000 100 100 000 Old_age Offline - 3000
169 Remaining_Lifetime_Perc 0x0000 100 100 000 Old_age Offline - 94
175 Program_Fail_Count_Chip 0x0000 100 100 000 Old_age Offline - 0
176 Erase_Fail_Count_Chip 0x0000 100 100 000 Old_age Offline - 0
177 Wear_Leveling_Count 0x0000 100 100 050 Old_age Offline - 728
178 Runtime_Invalid_Blk_Cnt 0x0000 100 100 000 Old_age Offline - 0
181 Program_Fail_Cnt_Total 0x0000 100 100 000 Old_age Offline - 0
182 Erase_Fail_Count_Total 0x0000 100 100 000 Old_age Offline - 0
192 Power-Off_Retract_Count 0x0000 100 100 000 Old_age Offline - 2
194 Temperature_Celsius 0x0000 100 100 000 Old_age Offline - 23
195 Hardware_ECC_Recovered 0x0000 100 100 000 Old_age Offline - 17829
196 Reallocated_Event_Count 0x0000 100 100 016 Old_age Offline - 0
197 Current_Pending_Sector 0x0000 100 100 000 Old_age Offline - 0
198 Offline_Uncorrectable 0x0000 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0000 100 100 050 Old_age Offline - 0
232 Available_Reservd_Space 0x0000 100 100 000 Old_age Offline - 100
241 Host_Writes_32MiB 0x0000 100 100 000 Old_age Offline - 696938
242 Host_Reads_32MiB 0x0000 100 100 000 Old_age Offline - 231431
245 TLC_Writes_32MiB 0x0000 100 100 000 Old_age Offline - 843626
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
7 0 65535 Read_scanning was completed without error
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.